• DDA/USB/PCIe/PXIe-5321A, 5322A
    DDA/USB/PCIe/PXIe-5321A, 5322A
    DDA/USB/PCIe/PXIe-5321A, 5322A
    DDA/USB/PCIe/PXIe-5321A, 5322A
    DDA/USB/PCIe/PXIe-5321A, 5322A
    DDA/USB/PCIe/PXIe-5321A, 5322A
    DDA/USB/PCIe/PXIe-5321A, 5322A
    DDA/USB/PCIe/PXIe-5321A, 5322A
    DDA/USB/PCIe/PXIe-5321A, 5322A
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  • DDA/USB/PCIe/PXIe-5321A, 5322A

    高精度220 ppm,18位分辨率,1 MS/s/ch 同步数据采集模块

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  • 配件
    • ACL-1016868

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    • TB-53

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商品描述

高精度220 ppm,18位分辨率,1 MS/s/ch 同步数据采集模块


主要特点

  • DC精度达220 ppm

  • 最高采样率:每通道 1 MS/s/ch

  • 模拟采集通道数:32通道 (JY-5321A),16 通道 (JY-5322A)

  • ADC分辨率至18 bits

  • 抗混叠滤波器:25 kHz, 220 kHz 软件可选,有效隔离带外干扰

  • 支持板载信号处理-过采样:降低噪声,提高有效分辨率

  • THD指标-99 dB

  • 噪声Noise指标最低达到7 µVrms

  • 最高达2 µV的分辨率

  • 扩大硬件定时 DIO 数量至 16 通道

  • 静态DIO:32通道 (JY-5321A),16 通道 (JY-5322A)

  • 计数器:2 通道 (JY-5321A),1 通道 (JY-5322A)




产品介绍

JY-5321A/5322A是两款高规格同步采集模块,核心参数与功能配置兼具精度与扩展性。模块DC精度达220 ppm,搭载18位ADC,每通道最高采样率1 MS/s;配备25 kHz/220 kHz 软件可选抗混叠滤波器,可有效隔离带外干扰,结合板载过采样技术,能降低噪声并提升有效分辨率。

硬件接口方面,两款均含16通道硬件定时DIO;JY-5321A拥有32路模拟采集通道、32通道静态DIO及2路计数器,JY-5322A则为16路模拟采集通道、16通道静态DIO及1路计数器,适配不同采集需求。该模块广泛应用于工业多参数监测、电子设备性能测试、自动化产线信号分析等场景,为高精度数据采集提供可靠支撑。

PXIe-5322A (PN: JY2463468-01)  |  16-ch, 18-bit, 1MS/s/ch , 16 DIO, PXIe Simultaneous sampling Multifunction I/O Module

PCIe-5322A (PN: JY7990862-01)  |  16-ch, 18-bit, 1MS/s/ch , 16 DIO, PCIe Simultaneous sampling Multifunction I/O Module

USB-5322A (PN: JY8830273-01)  |  16-ch, 18-bit, 1MS/s/ch , 16 DIO, USB Simultaneous sampling Multifunction I/O Module

DDA-5322A (PN: JY2412342-01)  |  Distributed Data Acquisition Platform with built-in 16-ch, 18-bit, 1MS/s/ch , 16 DIO, Simultaneous sampling Multifunction I/O Module

PXIe-5321A (PN: JY2463468-01)  |  32-ch, 18-bit, 1MS/s/ch , 32 DIO, PXIe Simultaneous sampling Multifunction I/O Module

PCIe-5321A (PN: JY7990862-01)  |  32-ch, 18-bit, 1MS/s/ch , 32 DIO, PCIe Simultaneous sampling Multifunction I/O Module

USB-5321A (PN: JY8830273-01)  |  32-ch, 18-bit, 1MS/s/ch , 32 DIO, USB Simultaneous sampling Multifunction I/O Module

DDA-5321A (PN: JY8830273-01)  |  Distributed Data Acquisition Platform with built-in  32-ch, 18-bit, 1MS/s/ch , 32 DIO, Simultaneous sampling Multifunction I/O Module


配件

TB-53 (PN: JY1368485-01)  |  68-Pin SCSI with BNC Terminal Block for JY-5300 Series

TB-68 (PN: JY2000068-04)  |  68-Pin SCSI  Shielded I/O Connector Block

ACL-1016868-1 (PN: JY7996916-01)  |  1M 68pin VHDC-SCSI twisted pair cable

ACL-1016868-2 (PN: JY7996916-02)  |  2M 68pin VHDCI-SCSI twisted pair cable

Main Features

  • High accuracy: 220 ppm

  • 32 (JY-5321A) / 16 (JY-5322A) simultaneous voltage measurement channels

  • 1 MS/s per channel

  • 18 bits resolution

  • Anti-aliasing Filter :25 KHz,220 KHz software selectable

  • THD -99dB

  • System noise as low as 9μVrm

  • Up to 2 μV resolution

  • Voltage ranges: ±0.25 V / ±0.5 V / ±1 V / ±2 V / ±5 V / ±10 V

  • 240 M samples of FIFO buffer

  • Analog and Digital Trigger

  • OSP: Oversampling to improve resolution and system noise

  • 32 PFI (JY-5321A)/16 PFI (JY-5322A)

  • 2 CIOs (JY-5321A)/1 CIO (JY-5322A)


Overview

The JY-5321A and JY-5322A are high-performance synchronous acquisition modules engineered to deliver uncompromising precision and flexible scalability for critical data acquisition tasks.

Boasting a DC accuracy of 220 ppm and an 18-bit ADC, paired with a 1 MS/s per-channel maximum sampling rate, these modules capture signals with exceptional clarity. The software-selectable 25 kHz/220 kHz anti-aliasing filters eliminate out-of-band interference effectively, while on-board oversampling technology further suppresses noise and boosts effective resolution.

With 16 hardware-timed DIO channels standard, the JY-5321A offers 32 analog input channels, 32 static DIO channels and 2 counters, while the JY-5322A provides 16 analog inputs, 16 static DIO channels and 1 counter—tailored to diverse application needs.

Ideal for industrial multi-parameter monitoring, electronic device performance testing and automated production line signal analysis, the JY-5321A/5322A deliver reliable, high-precision data acquisition to drive your critical testing workflows.

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